Comparative analysis of low dose-rate, accelerated, and standard cobalt-60 radiation response data for a low-dropout voltage regulator and a voltage reference

Author

Abare, Wayne ; Brueggeman, Frank ; Pease, Ron ; Krieg, Jeff ; Simons, Mayrant

Author_Institution

Harris Corp., Melbourne, FL, USA

fYear

2002

fDate

2002

Firstpage

177

Lastpage

180

Abstract

This paper presents the results of cobalt-60 response measurements made on a low dropout voltage regulator and a shunt reference for three different radiation test conditions: low dose rate, accelerated (elevated temperature irradiation) and standard (50-300 rad(SiO₂)/s). The accelerated test is shown to correlate well with the low dose rate failure of the reference but not for the failure of the regulator.

Keywords

failure analysis; integrated circuit reliability; integrated circuit testing; life testing; radiation hardening (electronics); reference circuits; space vehicle electronics; voltage regulators; 50 to 300 rad; accelerated testing; analog circuits; bipolar integrated circuits; cobalt-60 radiation tests; cobalt-60 response measurements; elevated temperature irradiation; failure analysis; ionization; low dose-rate tests; low-dropout voltage regulators; radiation effects; radiation test conditions; reference circuit low dose rate failure; shunt references; space applications; voltage reference IC; Acceleration; Circuit testing; Cranes; Ionizing radiation; Life estimation; Low voltage; Measurement standards; Regulators; Space technology; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2002 IEEE

Print_ISBN

0-7803-7544-0

Type

conf

DOI

10.1109/REDW.2002.1045550

Filename

1045550