• DocumentCode
    2424123
  • Title

    Pspice double void partial discharge simulation and detection using wavelet

  • Author

    Shwehdi, M.H. ; Al-Hawi, Y.

  • Author_Institution
    Dept. of Electr. Eng., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
  • fYear
    2003
  • fDate
    19-22 Oct. 2003
  • Firstpage
    563
  • Lastpage
    566
  • Abstract
    Partial Discharges (PD) on insulation in general is among the most vulnerable processes in the AC system that can cause a failure. Therefore, an effective early detection of insulation failure will significantly reduce chances of catastrophic failure in power system apparatus avoiding costly repair and power outage impact. The capacitive network representation of insulation has long been used for the study of impulse voltage distribution along the windings and, for PD detection and location. A Partial discharge (PD) model using Pspice as to generate void signals is used in this paper. The model includes the equivalent electrical circuit of solid inhomogeneous dielectrics with voids. This signal is then detected by a digital signal processing tool, which is the wavelet, under different noise intensities.
  • Keywords
    SPICE; electric breakdown; equivalent circuits; insulation testing; partial discharges; Pspice double void partial discharge simulation; capacitive network representation; catastrophic failure; costly repair; digital signal processing tool; impulse voltage distribution; insulation; insulation failure; power outage impact; power system apparatus; solid inhomogeneous dielectrics with voids; void signals; wavelet; windings; Circuits; Dielectrics and electrical insulation; Partial discharges; Power system modeling; Power system simulation; Signal detection; Signal generators; Signal processing; Solid modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
  • Print_ISBN
    0-7803-7910-1
  • Type

    conf

  • DOI
    10.1109/CEIDP.2003.1254917
  • Filename
    1254917