• DocumentCode
    2424178
  • Title

    First electron availability and PD generation in insulation cavities

  • Author

    Montanari, Gian ; Conti, M. ; Ciani, F. ; Cavallini, A. ; Mazzanti, G. ; Serra, S.

  • Author_Institution
    Bologna Univ., Italy
  • fYear
    2003
  • fDate
    19-22 Oct. 2003
  • Firstpage
    576
  • Lastpage
    580
  • Abstract
    An investigation on the behavior of partial discharges occurring in insulation cavities as a function of environmental conditions is presented in this paper. In particular, focus is made on peculiar conditions where semi-transparent insulation is subjected to different visible light intensity, is irradiated by UV or is kept in the dark. Experiments are carried out on cells with an artificial defect, obtained producing a spherical void in epoxy resin. It is shown that not only PD inception voltage is sensitive to fight wavelength and intensity, but also PD average delay time changes considerably. It can be speculated that inception voltage can be related prevailingly to either background radiation or field-assisted electron detrapping from defect surfaces, depending on defect geometry and environmental conditions.
  • Keywords
    electric breakdown; insulating materials; partial discharges; radiation effects; ultraviolet radiation effects; PD generation; artificial defect; average delay time; background radiation; defect geometry; defect surfaces; environmental conditions; epoxy resin; field-assisted electron detrapping; fight intensity; fight wavelength; first electron availability; inception voltage; insulation cavities; partial discharges; semi-transparent insulation; spherical void; visible light intensity; Breakdown voltage; Delay effects; Electrodes; Electrons; Epoxy resins; Lamps; Partial discharges; Plastic insulation; Space charge; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
  • Print_ISBN
    0-7803-7910-1
  • Type

    conf

  • DOI
    10.1109/CEIDP.2003.1254920
  • Filename
    1254920