DocumentCode :
2424302
Title :
Contamination induced stiction in drive level studies
Author :
Smallen, M. ; Mee, P. ; Merchant, K. ; Smith, S.
Author_Institution :
Seagate Technology
fYear :
1990
fDate :
17-20 April 1990
Keywords :
Contamination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1990. Digests of INTERMAG '90. International
Conference_Location :
Brighton, UK
Type :
conf
DOI :
10.1109/INTMAG.1990.734808
Filename :
734808
Link To Document :
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