• DocumentCode
    242451
  • Title

    High negative bias stability Gadolinium-doped Aluminum-Zinc-Oxide thin film transistors

  • Author

    Junchen Dong ; Dedong Han ; Feilong Zhao ; Nannan Zhao ; Jing Wu ; Zhuofa Chen ; Yingying Cong ; Shengdong Zhang ; Xing Zhang ; Lifeng Liu ; Yi Wang

  • Author_Institution
    Shenzhen Grad. Sch., Peking Univ., Shenzhen, China
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Thin film transistors (TFTs) with Gadolinium-doped Aluminum-Zinc-Oxide (Gd-AZO) thin film as the active layer were fabricated on glass substrate at room temperature. Amorphous Gd-AZO crystal structure which is benefit for high performance devices was obtained. The variation trend of TFTs properties with O2 partial pressure was investigated. Excellent negative bias stress stability and transmittance Gd-AZO TFTs was realized, too. The ultimate TFT has excellent properties such as a saturation mobility of 238 cm2/V·s, an on-to-off current ratio of 6.08×108, a threshold of 1.92V, and a sub-threshold swing of 161 mV/decade.
  • Keywords
    aluminium compounds; crystal structure; gadolinium; negative bias temperature instability; semiconductor device reliability; thin film transistors; AlZnO; Gd; amorphous Gd-AZO crystal structure; gadolinium-doped aluminum-zinc-oxide TFT; glass substrate; high negative bias stability; negative bias stress stability; oxide partial pressure; room temperature; temperature 293 K to 298 K; thin film transistors; voltage 1.92 V; Abstracts; Indium tin oxide; Logic gates; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021650
  • Filename
    7021650