DocumentCode :
2424795
Title :
Session 11: Session 11A: RF test
fYear :
2010
fDate :
19-22 April 2010
Firstpage :
329
Lastpage :
329
Abstract :
Start of the above-titled section of the conference proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2010 28th
Conference_Location :
Santa Cruz, CA
ISSN :
1093-0167
Print_ISBN :
978-1-4244-6649-8
Type :
conf
DOI :
10.1109/VTS.2010.5469538
Filename :
5469538
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2424795
