DocumentCode
2424993
Title
Benchmarking patenting procedures: a conceptual model of the procedure and experiences of R&D scientists
Author
Mathew, Michael
Author_Institution
Dept. of Manage. Studies, Indian Inst. of Sci., Bangalore
fYear
1997
fDate
27-31 Jul 1997
Firstpage
950
Abstract
Summary form only given. When economic policies liberalize the competitive efficiency of the National Patent System (NPS) is of immense significance. The stress on global leadership through technological breakthrough brings in the agenda for protection. With the 1991 economic liberalization, India is witnessing this paradigm shift. Steps towards building a patent culture is visible in science and technology laboratories such as the CSIR and IISc. The need to understand what other nations are doing and benchmark the patent process is imperative for the competitive efficiency of the NPS. The stages that R&D personnel go through are eight in number. They are idea, R&D activity, writing the technical specification, Patent Office (PO) evaluation, clarifications, award of patent, the reward for patent and commercialization and publications. At each of these phases, various components that are crucial in a NPS play a role. The components such as PO, organizational factors, legal infrastructure, scientist and informational databases are illustrated in the paper. The processes and procedures of these components can be measured for efficiency. A framework of component processes for each stage developed based on the Indian procedures can be compared for efficiency across nations and benchmarked. This will provide an international standard of efficiency of the NPS. It will provide for more progressive and competitive patent worthy R&D
Keywords
patents; research and development management; technology transfer; India; National Patent System; R&D management; R&D personnel; R&D scientists; conceptual model; global leadership; patenting procedures benchmarking; technological breakthrough; technological innovation; Commercialization; Laboratories; Law; Personnel; Protection; Research and development; Research and development management; Statistics; Stress; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International Conference on Management and Technology
Conference_Location
Portland, OR
Print_ISBN
0-7803-3574-0
Type
conf
DOI
10.1109/PICMET.1997.653724
Filename
653724
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