• DocumentCode
    2425093
  • Title

    Detection of upset induced execution errors in microprocessors

  • Author

    Khan, Mohammad Ziaullah ; Tront, Joseph G.

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    1989
  • fDate
    22-24 March 1989
  • Firstpage
    82
  • Lastpage
    86
  • Abstract
    The authors discuss the types of errors in a radiation environment and propose fault models for instruction execution errors. A scheme is suggested for detecting execution errors through the online monitoring of the system. The theoretical estimate for the error coverage of the proposed scheme is about 85% of all single-bit errors in an instruction word. The exact error coverage will vary as it depends on the nature of program under execution on the microprocessor. At present the design of the watchdog processor hardware is in progress.<>
  • Keywords
    computer testing; error detection; fault location; microprocessor chips; radiation hardening (electronics); error detection; exact error coverage; fault models; instruction word; microprocessors; online monitoring; radiation environment; upset induced execution errors; Capacitance; Circuit faults; Control systems; Digital systems; Electromagnetic transients; Error correction; Fault detection; Microprocessors; Satellites; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Communications, 1989. Conference Proceedings., Eighth Annual International Phoenix Conference on
  • Conference_Location
    Scottsdale, AZ, USA
  • Print_ISBN
    0-8186-1918-x
  • Type

    conf

  • DOI
    10.1109/PCCC.1989.37365
  • Filename
    37365