DocumentCode
242523
Title
A one-piece compact model for tunneling FETs
Author
Zelei Sun ; Li Zhang ; Jinyu Zhang ; Zhiping Yu
Author_Institution
Inst. of Microelectron., Tsinghua Univ., Beijing, China
fYear
2014
fDate
28-31 Oct. 2014
Firstpage
1
Lastpage
3
Abstract
A new, one-piece tunneling FET compact model has been developed based on its physical characteristics. By introducing the drain threshold voltage, the nonlinear current increase in the normally linear region of the output characteristics is modeled. The model prediction has been compared with several experimental data and good agreement is achieved.
Keywords
field effect transistors; tunnel transistors; drain threshold voltage; nonlinear current; normally linear region; one-piece compact model; physical characteristics; tunneling FET; Abstracts; Lead;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4799-3296-2
Type
conf
DOI
10.1109/ICSICT.2014.7021686
Filename
7021686
Link To Document