DocumentCode
2425464
Title
On multiple bridging faults
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2010
fDate
19-22 April 2010
Firstpage
221
Lastpage
226
Abstract
Multiple faults are typically detected by test sets for single faults. For bridging faults, we show that fault activation conditions are more difficult to create for certain multiple faults than for the single faults that comprise them. As a result, a test set for single bridging faults may leave significant percentages of detectable multiple faults undetected. We discuss three such cases, corresponding to three types of bridging faults, and present experimental results for one of them. As part of this study we consider the ability of a 10-detection test set for single stuck-at faults to detect multiple bridging faults of this type.
Keywords
fault diagnosis; logic testing; fault activation conditions; multiple bridging faults; single stuck-at faults; Circuit faults; Cities and towns; Electrical fault detection; Fault detection; Manufacturing; Robustness; Testing; Very large scale integration; bridging faults; fault simulation; multiple faults; n -detection test sets; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2010 28th
Conference_Location
Santa Cruz, CA
ISSN
1093-0167
Print_ISBN
978-1-4244-6649-8
Type
conf
DOI
10.1109/VTS.2010.5469573
Filename
5469573
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