• DocumentCode
    2425464
  • Title

    On multiple bridging faults

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • fDate
    19-22 April 2010
  • Firstpage
    221
  • Lastpage
    226
  • Abstract
    Multiple faults are typically detected by test sets for single faults. For bridging faults, we show that fault activation conditions are more difficult to create for certain multiple faults than for the single faults that comprise them. As a result, a test set for single bridging faults may leave significant percentages of detectable multiple faults undetected. We discuss three such cases, corresponding to three types of bridging faults, and present experimental results for one of them. As part of this study we consider the ability of a 10-detection test set for single stuck-at faults to detect multiple bridging faults of this type.
  • Keywords
    fault diagnosis; logic testing; fault activation conditions; multiple bridging faults; single stuck-at faults; Circuit faults; Cities and towns; Electrical fault detection; Fault detection; Manufacturing; Robustness; Testing; Very large scale integration; bridging faults; fault simulation; multiple faults; n -detection test sets; test generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2010 28th
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4244-6649-8
  • Type

    conf

  • DOI
    10.1109/VTS.2010.5469573
  • Filename
    5469573