DocumentCode :
2425905
Title :
US high-technology export controls in a changed global environment, firm size, and competitiveness
Author :
Anyanwu, Len
Author_Institution :
Sch. of Ind. Manage., New Jersey Inst. of Technol., Newark, NJ, USA
fYear :
1997
fDate :
27-31 Jul 1997
Firstpage :
1001
Abstract :
Summary form only as given. With policies that impose barriers to export sales that do not exist for domestic sales, exporting of high technology products with actual or potential military applications have faced different treatment in the United States, for national security reasons. This paper explored the direct and indirect implications of high-technology export controls for the high-technology industry, by firm size and the overall US economy, using a fully specified recursive regression model on time series data for a 15 year period. An indirect effect is observed-whereby the export performance of particularly small high technology firms which appears to contribute positively to US global competitiveness, is adversely affected by export controls. Intuitively, small firms may depend more on direct export sales than the big firms which have other means (foreign direct investment, the use of overseas affiliates for foreign sales, etc.) of reaching international markets
Keywords :
government policies; international trade; management; statistical analysis; time series; USA; competitiveness; export performance; firm size; global environment; high-technology export controls; high-technology industry; international markets; national security; recursive regression model; small high technology firms; time series data; Costs; Cultural differences; Defense industry; Food technology; Globalization; Industrial control; Manufacturing industries; Marketing and sales; Size control; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International Conference on Management and Technology
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-3574-0
Type :
conf
DOI :
10.1109/PICMET.1997.653765
Filename :
653765
Link To Document :
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