• DocumentCode
    2426107
  • Title

    Selecting the most relevant structural Fmax for system Fmax correlation

  • Author

    Chen, Janine ; Zeng, Jing ; Wang, Li.-C. ; Rearick, Jeff ; Mateja, Michael

  • Author_Institution
    Dept. of ECE, UC-Santa Barbara, Santa Barbara, CA, USA
  • fYear
    2010
  • fDate
    19-22 April 2010
  • Firstpage
    99
  • Lastpage
    104
  • Abstract
    The use of low-cost structural Fmax measurement as a replacement for in-system Fmax measurement for speed binning has been aided by the use of a data-learning approach that can be used to build a reliable system Fmax predictor given structural Fmax. This paper uses industry test measurements to demonstrate why a data-learning approach for correlation is better than simple correlation approaches, how to select the most relevant structural Fmax, and how the proposed methodology works on multiple lots.
  • Keywords
    integrated circuit testing; data-learning approach; in-system Fmax measurement; industry test measurements; speed binning; structural Fmax measurement; system Fmax correlation; Correlation; Economic forecasting; Flip-flops; Fluid flow measurement; Logic testing; Measurement standards; Semiconductor device measurement; System testing; Velocity measurement; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2010 28th
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4244-6649-8
  • Type

    conf

  • DOI
    10.1109/VTS.2010.5469604
  • Filename
    5469604