DocumentCode
2426107
Title
Selecting the most relevant structural Fmax for system Fmax correlation
Author
Chen, Janine ; Zeng, Jing ; Wang, Li.-C. ; Rearick, Jeff ; Mateja, Michael
Author_Institution
Dept. of ECE, UC-Santa Barbara, Santa Barbara, CA, USA
fYear
2010
fDate
19-22 April 2010
Firstpage
99
Lastpage
104
Abstract
The use of low-cost structural Fmax measurement as a replacement for in-system Fmax measurement for speed binning has been aided by the use of a data-learning approach that can be used to build a reliable system Fmax predictor given structural Fmax. This paper uses industry test measurements to demonstrate why a data-learning approach for correlation is better than simple correlation approaches, how to select the most relevant structural Fmax, and how the proposed methodology works on multiple lots.
Keywords
integrated circuit testing; data-learning approach; in-system Fmax measurement; industry test measurements; speed binning; structural Fmax measurement; system Fmax correlation; Correlation; Economic forecasting; Flip-flops; Fluid flow measurement; Logic testing; Measurement standards; Semiconductor device measurement; System testing; Velocity measurement; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2010 28th
Conference_Location
Santa Cruz, CA
ISSN
1093-0167
Print_ISBN
978-1-4244-6649-8
Type
conf
DOI
10.1109/VTS.2010.5469604
Filename
5469604
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