Title :
Selecting the most relevant structural Fmax for system Fmax correlation
Author :
Chen, Janine ; Zeng, Jing ; Wang, Li.-C. ; Rearick, Jeff ; Mateja, Michael
Author_Institution :
Dept. of ECE, UC-Santa Barbara, Santa Barbara, CA, USA
Abstract :
The use of low-cost structural Fmax measurement as a replacement for in-system Fmax measurement for speed binning has been aided by the use of a data-learning approach that can be used to build a reliable system Fmax predictor given structural Fmax. This paper uses industry test measurements to demonstrate why a data-learning approach for correlation is better than simple correlation approaches, how to select the most relevant structural Fmax, and how the proposed methodology works on multiple lots.
Keywords :
integrated circuit testing; data-learning approach; in-system Fmax measurement; industry test measurements; speed binning; structural Fmax measurement; system Fmax correlation; Correlation; Economic forecasting; Flip-flops; Fluid flow measurement; Logic testing; Measurement standards; Semiconductor device measurement; System testing; Velocity measurement; Very large scale integration;
Conference_Titel :
VLSI Test Symposium (VTS), 2010 28th
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-1-4244-6649-8
DOI :
10.1109/VTS.2010.5469604