DocumentCode :
2426403
Title :
Hermeticity and stiction in MEMS packaging
Author :
Jacobs, S.Joshua ; Miller, Seth A. ; Malone, Joshua J. ; McDonald, William C. ; Lopes, Vincent C. ; Magel, Lissa K.
Author_Institution :
DLP Products, Texas Instrum. Inc., Dallas, TX, USA
fYear :
2002
fDate :
2002
Firstpage :
136
Lastpage :
139
Abstract :
Exposure of operating MEMS structures to atmospheric gasses may have deleterious effects on device performance. Here we consider from a phenomenological point of view the effects that moisture has on both short- and long-term performance characteristics of Texas Instruments´ Digital Micromirror Device (DMD). As an array of up to 1.3 million mirrors, a single DMD can provide a wealth of statistical information; compilations of device statistics provide thorough descriptions of effects that may be obtained through static or operational aging with a variety of package environments. The detection sensitivity of our test methods provides significant insight into the global and local effects of package environment, including the effects of water on device operation.
Keywords :
ageing; micro-optics; micromechanical devices; mirrors; moisture; seals (stoppers); semiconductor device packaging; semiconductor device reliability; statistical analysis; stiction; MEMS packaging; atmospheric gasses; detection sensitivity; device statistics; digital micromirror device; global effects; hermeticity; local effects; long-term performance; moisture; operational aging; package environments; phenomenological effects; short-term performance; static aging; statistical information; stiction; Adhesives; Jacobian matrices; Magnesium compounds; Microelectromechanical devices; Micromechanical devices; Micromirrors; Mirrors; Moisture; Packaging; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium Proceedings, 2002. 40th Annual
Print_ISBN :
0-7803-7352-9
Type :
conf
DOI :
10.1109/RELPHY.2002.996625
Filename :
996625
Link To Document :
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