DocumentCode :
2426736
Title :
A new system-reliability assessment methodology
Author :
Denson, William K. ; Keene, Samuel ; Caroli, Joseph
Author_Institution :
Reliability Anal. Centre, Rome, Italy
fYear :
1998
fDate :
19-22 Jan 1998
Firstpage :
413
Lastpage :
420
Abstract :
A methodology has been developed for assessing the reliability of electronic systems. This methodology consists of modifying a base reliability estimate with process grading factors for the following failure causes: parts; design; manufacturing; system management; induced; and no defect found. These process grades correspond to the degree to which actions have been taken to mitigate the occurrence of system failure due to these failure categories. Once the base estimate is modified with the process grades, the reliability is further modified by empirical data taken throughout system development and testing. This modification is accomplished using Bayesian techniques which apply the appropriate weights for the different data elements. Advantages of this new methodology are that it: uses all available information to form the best estimate of field reliability; is tailorable; has quantifiable confidence bounds; and has sensitivity to the predominant system reliability drivers
Keywords :
Bayes methods; circuit reliability; failure analysis; reliability theory; Bayesian techniques; base reliability estimate; electronic systems; failure causes; process grading factors; reliability assessment methodology; system failure; weights; Bayesian methods; Driver circuits; Information analysis; Life testing; Maintenance; Manufacturing processes; Military standards; Performance analysis; Predictive models; Reliability; Standardization; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1998. Proceedings., Annual
Conference_Location :
Anaheim, CA
ISSN :
0149-144X
Print_ISBN :
0-7803-4362-X
Type :
conf
DOI :
10.1109/RAMS.1998.653813
Filename :
653813
Link To Document :
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