• DocumentCode
    2426791
  • Title

    Combining Skin-Color Detector and Evidence Aggregated Random Field Models towards Validating Face Detection Results

  • Author

    Krishna, Sreekar ; Panchanathan, Sethuraman

  • Author_Institution
    Sch. of Comput. & Inf. (SCI), Arizona State Univ., Tempe, AZ
  • fYear
    2008
  • fDate
    16-19 Dec. 2008
  • Firstpage
    466
  • Lastpage
    473
  • Abstract
    In this paper, a framework for validating any generic face detection algorithm´s result is proposed. A two stage cascaded face validation filter is described that relies on a skin-color detector and on a face silhouette structure modeler towards increasing face detection capacity of any face detection algorithm. While the skin-color detector combines a static skin-color and a dynamic background-color modeler, the face silhouette structure modeler incorporates an aggregate of random field models combined through a Dempster-Shafer framework of evidence merging. Together, the two modelers validate any face subimage generated by face detection algorithms. Experiments conducted on FERET and on an in-house face database supports the claim for improved face detection results using the proposed filter. An extension of the same framework towards head pose estimation is also suggested.
  • Keywords
    face recognition; image colour analysis; pose estimation; Dempster-Shafer framework; background-color modeler; evidence aggregated random field models; face database; face silhouette structure modeler; face validation filter; generic face detection algorithm; pose estimation; skin-color detector; Aggregates; Computational complexity; Computer graphics; Computer vision; Detectors; Face detection; Filters; Humans; Image processing; Skin; Dempster-Shafer Theory of Evidence; Face Detection; Random Field Models. Skin-Color Detection; Statistical Structural Models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, Graphics & Image Processing, 2008. ICVGIP '08. Sixth Indian Conference on
  • Conference_Location
    Bhubaneswar
  • Print_ISBN
    978-0-7695-3476-3
  • Electronic_ISBN
    978-0-7695-3476-3
  • Type

    conf

  • DOI
    10.1109/ICVGIP.2008.13
  • Filename
    4756107