Title :
Phase Delay Measurement and Calibration in Built-In Analog Functional Testing
Author :
Qin, Jie ; Stroud, Charles ; Dai, Foster
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., AL
Abstract :
A built-in self-test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the effects of phase delay on analog functionality measurements in mixed-signal systems when using MAC-based ORAs. We show that phase delay has a critical impact on measurement results and that the MAC-based ORA is an effective method for measuring phase delay.
Keywords :
analogue circuits; automatic test pattern generation; built-in self test; circuit testing; direct digital synthesis; mixed analogue-digital integrated circuits; analog circuitry; built-in analog functional testing; built-in self-test; calibration; direct digital synthesizer; mixed-signal systems; multiplier-accumulator based output response analyzer; phase delay measurement; test pattern generator; Built-in self-test; Calibration; Circuit testing; Delay effects; Frequency measurement; Frequency response; Noise measurement; Performance evaluation; Phase measurement; System testing;
Conference_Titel :
System Theory, 2007. SSST '07. Thirty-Ninth Southeastern Symposium on
Conference_Location :
Macon, GA
Print_ISBN :
1-4244-1126-2
Electronic_ISBN :
0094-2898
DOI :
10.1109/SSST.2007.352336
