Phase Delay Measurement and Calibration in Built-In Analog Functional Testing

Author

Qin, Jie ; Stroud, Charles ; Dai, Foster

Author_Institution

Dept. of Electr. & Comput. Eng., Auburn Univ., AL

fYear

2007

fDate

4-6 March 2007

Firstpage

145

Lastpage

149

Abstract

A built-in self-test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the effects of phase delay on analog functionality measurements in mixed-signal systems when using MAC-based ORAs. We show that phase delay has a critical impact on measurement results and that the MAC-based ORA is an effective method for measuring phase delay.

Keywords

analogue circuits; automatic test pattern generation; built-in self test; circuit testing; direct digital synthesis; mixed analogue-digital integrated circuits; analog circuitry; built-in analog functional testing; built-in self-test; calibration; direct digital synthesizer; mixed-signal systems; multiplier-accumulator based output response analyzer; phase delay measurement; test pattern generator; Built-in self-test; Calibration; Circuit testing; Delay effects; Frequency measurement; Frequency response; Noise measurement; Performance evaluation; Phase measurement; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

System Theory, 2007. SSST '07. Thirty-Ninth Southeastern Symposium on

Conference_Location

Macon, GA

ISSN

0094-2898

Print_ISBN

1-4244-1126-2

Electronic_ISBN

0094-2898

Type

conf

DOI

10.1109/SSST.2007.352336

Filename

4160822