DocumentCode :
2427291
Title :
Basic study of brain injury mechanism caused by cavitation
Author :
Kurosawa, Y. ; Kato, K. ; Saito, S. ; Kubo, M. ; Uzuka, T. ; Fujii, Y. ; Takahashi, H.
Author_Institution :
Dept. of Mech. Eng. Inf., Meiji Univ., Kawasaki, Japan
fYear :
2009
fDate :
3-6 Sept. 2009
Firstpage :
7224
Lastpage :
7227
Abstract :
The purpose of this study is to discuss the mechanism of brain injury experimentally, with respect to the pressure changes on the surface of a brain agar phantom by cavitation. First, an experimental system to perform an impact experiment is presented. We present some images taken by a high-speed camera of the behavior of a simple physical head model with and without the brain agar phantom during impact. From the photographs of the high-speed camera, we can confirm that cavitation bubbles occur at the contrecoup side, irrespective of the usage of the brain agar phantom. Second, two experimental systems to perform impact and strike experiments are presented. The pressure changes on the surface of the brain agar phantom at contrecoup side were measured by two kinds of experiments and impact velocities. Frequency analysis of the measured pressure changes was conducted by FFT software. From these results, we found that the collapse of cavitation bubbles at the contrecoup side can strongly affect the characteristics of pressure changes on the surface of the brain agar phantom.
Keywords :
brain; brain models; bubbles; cavitation; fast Fourier transforms; neurophysiology; phantoms; FFT software; brain agar phantom; brain injury mechanism; cavitation bubbles; contrecoup side; frequency analysis; high-speed camera; impact experiment; pressure change measurement; pressure changes; strike experiment; Agar; Biomechanics; Biomedical Engineering; Brain Injuries; Computer Simulation; Fourier Analysis; Humans; Models, Neurological; Phantoms, Imaging; Pressure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location :
Minneapolis, MN
ISSN :
1557-170X
Print_ISBN :
978-1-4244-3296-7
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2009.5335260
Filename :
5335260
Link To Document :
بازگشت