DocumentCode :
2427340
Title :
Stiction of parylene C to silicon surface measured using blister tests
Author :
Yu, Feiqiao ; Lin, Jeffrey Chun-Hui ; Chen, Po-Jui ; Tai, Yu-Chong
Author_Institution :
Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
fYear :
2010
fDate :
20-23 Jan. 2010
Firstpage :
313
Lastpage :
316
Abstract :
Micro-fabricated biocompatible check valves are integral parts of many implantable micro-fluidic devices. The cracking pressure of check valves is usually controlled by stiction between polymeric films and the underlying substrate. The following paper presents the first comprehensive study of stiction between parylene and silicon surfaces. The valves are fabricated using surface micromachining with parylene C as the structural material. Deep Reactive Ion Etching (DRIE) is used to create through holes in the wafer for the passage of fluids. Blister test is employed to calculate stiction. From experimental results, stiction between parylene C and silicon surfaces is found to be 2.59 J/m2, which is comparable to the stiction between silicon and other polymeric thin films.
Keywords :
electron tubes; microfluidics; micromachining; polymer films; blister tests; deep reactive ion etching; implantable micro-fluidic devices; micro-fabricated biocompatible check valves; parylene; polymeric films; silicon surface; stiction; surface micromachining; blister test; check valve; parylene; stiction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
Type :
conf
DOI :
10.1109/NEMS.2010.5592220
Filename :
5592220
Link To Document :
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