DocumentCode :
2427578
Title :
Evolution of mechanical property of nanocomposite TiSiN films using reactive magnetron cosputtering
Author :
Chung, C.K. ; Jhu, J.J. ; Chang, S.C. ; Wu, B.H.
Author_Institution :
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2010
fDate :
20-23 Jan. 2010
Firstpage :
344
Lastpage :
347
Abstract :
The nanocomposite Ti-Si-N thin flims were prepared by reactive magnetron co-sputtering system. The experimental parameter effect on the evolution of mechanical property of nanocomposite TiSiN Films was investigated. The Ti-Si-N film is a mixed composite consisting of the Ti-Si, Ti-N and Si-N compounds. As Si is added to the polycrystalline Ti-N compound to form Ti-Si-N, the microstructure becomes nanocrystalline grains embedded in a disordered Ti-Si-N or SiNx amorphous matrix i.e. nanocomposite quasi-amorphous microstructure, which is affected by the experimental parameters of nitrogen flow ratio (FN2%, 3, 5, 10 %), Ti power (75, 100, 150 W) and Si power (100, 150 and 200 W) during co-sputtering. The thickness, structural, morphology, chemical composition and mechanical properties of films were characterized by alpha-stepper profiler, Grazing Incidence X-ray Diffraction (GIXRD), scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS) and nanoindenter, respectively. The experimental result shows that deposition rate decreased with increasing FN2%. According to Scherrer´s formula, the grain size of films was below 5 nm. The surface morphology each film was very smooth due to fine grains. The hardness and modulus of Ti-Si-N can be enhanced by Ti power and reducing Si power. In this paper, the maximum hardness of 24.86 GPa and Young´s modulus of 183.65 GPa was obtained at Ti 150 W, Si 100 W and 5 FN%.
Keywords :
X-ray chemical analysis; X-ray diffraction; Young´s modulus; grain size; nanocomposites; nanoindentation; scanning electron microscopy; silicon compounds; sputter deposition; surface morphology; titanium compounds; EDS; SEM; Scherrer formula; TiSiN; Young´s modulus; alpha-stepper profiler; amorphous matrix; chemical composition; energy dispersive spectroscopy; grain size; grazing incidence X-ray diffraction; mechanical property; nanocomposite thin films; nanocrystalline grains; nanoindenter; polycrystalline compound; quasiamorphous microstructure; reactive magnetron cosputtering; scanning electron microscopy; surface morphology; Ti-Si-N; mechanical properties; nanocomposite; texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
Type :
conf
DOI :
10.1109/NEMS.2010.5592231
Filename :
5592231
Link To Document :
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