DocumentCode
2427729
Title
Design and testing of silicon carbide JFETs based inverter
Author
Pan, Sanbo ; Mi, Chris ; Lin, Tim
Author_Institution
Dept. of Electr., Electron. & Inf. Eng., Anyang Normal Univ., Anyang, China
fYear
2009
fDate
17-20 May 2009
Firstpage
2556
Lastpage
2560
Abstract
This paper presents the design and testing of a high frequency, high efficiency inverter using silicon carbide (SiC) JFETs power module. A rugged negative voltage gate drive circuit is used to solve the normally on problem of JFETs devices and avoid the bridge shot-through during power on or power off. The circuit can provide over-voltage protection, over current protection and over temperature protection circuits to ensure the safe operation of the SiC JFETs module and the integration of inverter system. SiC JFETs pspice model is established and discussed that the drive resistor voltage drop of SiC JFETs due to dv/dt is more severe than Si IGBT device compared the parameters of SiC JFET and Si IGBT at the same rated level. The simulation and measurement results show that SiC JFETs have short turn-on and turn-off times, which will result in lower switching losses than silicon (Si) IGBTs. The low on-resistance in SiC JFETs will result in lower conduction losses. The experiment results of a 1kW SiC JFETs based inverter showed at least 3% efficiency improvement by a SiC JFETs based inverter over a Si IGBT- based inverter.
Keywords
driver circuits; invertors; junction gate field effect transistors; power semiconductor devices; semiconductor device models; silicon compounds; IGBT device; JFET; SiC; high efficiency inverter; negative voltage gate drive circuit; Bridge circuits; Circuit testing; Frequency; Insulated gate bipolar transistors; Inverters; JFETs; Multichip modules; Power system protection; Silicon carbide; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Motion Control Conference, 2009. IPEMC '09. IEEE 6th International
Conference_Location
Wuhan
Print_ISBN
978-1-4244-3556-2
Electronic_ISBN
978-1-4244-3557-9
Type
conf
DOI
10.1109/IPEMC.2009.5157835
Filename
5157835
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