Title :
Simulation research on a novel micro-fluidic self-destruct device for microchips
Author :
Gu, Xinwei ; Lou, Wenzhong ; Song, Rongchang ; Zhao, Yue ; Zhang, Longfei
Author_Institution :
Nat. Key Lab. of Mechatron. Eng. & Control, Beijing Inst. of Technol., Beijing, China
Abstract :
A novel Micro-Fluidic Self-destruct Device (MFSD) for microchips has been exploited; the purpose of the MFSD is to destroy the structure and date of the microchip, especially in abnormal environment. According to the characteristic of abnormal environment, this article puts forward self-absorb self-destruct system based on micro-fluidic for the memory chip, and this system can sense the stranger´s hand-teardown, then mix two kinds of liquid into one chemical preparation, and spray them on the chip which can erase the data in chip permanently, which can make sure the memory chip self-destruct credibility finally, and realize the aim of protecting the know-how structure and date. Based on the depiction of design ideas above, in this article we construct the model of self-absorb mixture structure, and make simulation to the flow field distribution and mixed phenomenon of the micro-fluidic mixer in microcosmic size. Finally, we make analysis of the pressure, velocity and density distribution of the micro-fluidic in micro-channel, through changing the inlet velocity, work over its effect on pressure, volume percent of two kinds of liquid and density.
Keywords :
cryptography; microfluidics; microprocessor chips; storage management chips; MFSD; abnormal environment; flow field distribution; inlet velocity; memory chip self-destruct credibility; microchannel; microchips; microcosmic size; microfluidic mixer; microfluidic self-destruct device; mixed phenomenon; self-absorb mixture structure; self-absorb self-destruct system; abnormal environment; micro-fluidic; micro-mixer; self-destruct;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
DOI :
10.1109/NEMS.2010.5592243