DocumentCode :
2427936
Title :
A Quartic Solution Covering Freeze-out and Exhaustion in P-type Compensated Semiconductors
Author :
Fenley, Justin ; Pieper, R.
Author_Institution :
Dept. of Electr. Eng., Texas Univ., Tyler, TX
fYear :
2007
fDate :
4-6 March 2007
Firstpage :
291
Lastpage :
295
Abstract :
The local charge neutrality condition for partially compensated P-type doubly-doped uniform equilibrium semiconductors is shown to lead to a quartic polynomial in a Z-parameter that is directly proportional to the concentration of holes. Analysis demonstrates that the problem is solvable exactly by identifying the only physically permissible root to a quartic polynomial. The unique solution for Z leads directly to analytic expressions for temperature dependent majority carrier concentration and the Fermi level.
Keywords :
Fermi level; compensation; polynomials; semiconductor doping; Fermi level; Z-parameter; exhaustion effects; freeze-out effects; local charge neutrality condition; partially compensated P-type doubly-doped uniform equilibrium semiconductors; quartic polynomial; temperature dependent majority carrier concentration; Charge carrier processes; Electrons; Equations; FET integrated circuits; Ion implantation; Lead compounds; Network address translation; Polynomials; Semiconductor impurities; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System Theory, 2007. SSST '07. Thirty-Ninth Southeastern Symposium on
Conference_Location :
Macon, GA
ISSN :
0094-2898
Print_ISBN :
1-4244-1126-2
Electronic_ISBN :
0094-2898
Type :
conf
DOI :
10.1109/SSST.2007.352368
Filename :
4160854
Link To Document :
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