DocumentCode
2428380
Title
Extracting Thermal Data from High Power MCM Packages
Author
Galloway, Jesse E. ; Sutton, Matthew
Author_Institution
Amkor Technol., Chandler, AZ
fYear
2007
fDate
18-22 March 2007
Firstpage
1
Lastpage
6
Abstract
An experimental method was presented for characterizing the thermal performance of multi-chip modules (MCMs) using different size heat sinks. A flip chip package, having a total of five active components, was tested at various power level combinations using a flow bench test facility to supply air flow at a controlled velocity. A linear superposition model, developed for each sink, accurately predicted junction temperatures for a range of power combinations and flow velocities. For the specific package and range of power conditions tested, a more general empirically based model predicted junction temperatures as a function of heat sink size, flow velocity and power level combinations.
Keywords
flip-chip devices; heat sinks; multichip modules; thermal management (packaging); FCBGA; air flow; flip chip package; heat sinks; high power MCM packages; junction temperatures; linear superposition model; multichip modules; thermal data; thermal performance; Cogeneration; Data mining; Flip chip; Heat sinks; Packaging; Predictive models; Temperature distribution; Test facilities; Testing; Velocity control; FCBGA; Linear Superposition; MCM; Thermal;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
1-4244-09589-4
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/STHERM.2007.352384
Filename
4160878
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