• DocumentCode
    2428380
  • Title

    Extracting Thermal Data from High Power MCM Packages

  • Author

    Galloway, Jesse E. ; Sutton, Matthew

  • Author_Institution
    Amkor Technol., Chandler, AZ
  • fYear
    2007
  • fDate
    18-22 March 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    An experimental method was presented for characterizing the thermal performance of multi-chip modules (MCMs) using different size heat sinks. A flip chip package, having a total of five active components, was tested at various power level combinations using a flow bench test facility to supply air flow at a controlled velocity. A linear superposition model, developed for each sink, accurately predicted junction temperatures for a range of power combinations and flow velocities. For the specific package and range of power conditions tested, a more general empirically based model predicted junction temperatures as a function of heat sink size, flow velocity and power level combinations.
  • Keywords
    flip-chip devices; heat sinks; multichip modules; thermal management (packaging); FCBGA; air flow; flip chip package; heat sinks; high power MCM packages; junction temperatures; linear superposition model; multichip modules; thermal data; thermal performance; Cogeneration; Data mining; Flip chip; Heat sinks; Packaging; Predictive models; Temperature distribution; Test facilities; Testing; Velocity control; FCBGA; Linear Superposition; MCM; Thermal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    1-4244-09589-4
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2007.352384
  • Filename
    4160878