DocumentCode
2428544
Title
Statistical analysis and optimization of IC technology: program package for training and design via Internet/Intranet
Author
Stempitsky, V.R.
fYear
2003
fDate
18-22 Feb. 2003
Firstpage
571
Abstract
Program package for training and design via Internet/Intranet for statistical analysis and optimization of IC technology is presented in this paper.
Keywords
Internet; circuit optimisation; computer based training; integrated circuit design; integrated circuit yield; intranets; semiconductor process modelling; software packages; statistical analysis; IC technology; IC yield; Internet; Intranet; circuit simulation; design; optimization; process parameters; process simulation; response surface methodology; software package; statistical analysis; training; Analytical models; Design optimization; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit packaging; Integrated circuit technology; Internet; Manufacturing processes; Space technology; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference. The Experience of Designing and Application of
Print_ISBN
966-553-278-2
Type
conf
DOI
10.1109/CADSM.2003.1255160
Filename
1255160
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