Title :
Statistical analysis and optimization of IC technology: program package for training and design via Internet/Intranet
Author :
Stempitsky, V.R.
Abstract :
Program package for training and design via Internet/Intranet for statistical analysis and optimization of IC technology is presented in this paper.
Keywords :
Internet; circuit optimisation; computer based training; integrated circuit design; integrated circuit yield; intranets; semiconductor process modelling; software packages; statistical analysis; IC technology; IC yield; Internet; Intranet; circuit simulation; design; optimization; process parameters; process simulation; response surface methodology; software package; statistical analysis; training; Analytical models; Design optimization; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit packaging; Integrated circuit technology; Internet; Manufacturing processes; Space technology; Statistical analysis;
Conference_Titel :
CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference. The Experience of Designing and Application of
Print_ISBN :
966-553-278-2
DOI :
10.1109/CADSM.2003.1255160
