Reliability and precision increase of amplitude-temporal transformers of build-in microelectroelectronic systems

Author

Ivanciv, Roman ; Lobur, Mykhaylo

Author_Institution

CAD/CAM Dept., Lviv Polytech. Nat. Univ., Ukraine

fYear

2003

fDate

18-22 Feb. 2003

Firstpage

581

Lastpage

583

Abstract

Traditional reliability rise method is reserving of apparatus. Reserving can be "cold" or "hot". In both cases there must be an arbiter (device or operator), which determines a technical apparatus state, chooses a most workable channel out of the reserved ones and includes this channel. Such methodology of reliability rise produces the tangible results, but has some peculiarities. The intervention of arbiter is also necessary at faults, and there will be momentary function execution break with reserved device at reserve switching.

Keywords

digital voltmeters; fault tolerance; mechatronics; potential transformers; amplitude-temporal transformers; build-in microelectroelectronic systems; enumerated faults; fault tolerance; impulse voltmeter; logic reserving; precision increase; reliability increase; reserve switching; time-digit transformer; CADCAM; Circuit faults; Computer aided manufacturing; Earth; Fault tolerant systems; Logic devices; Microelectronics; Rockets; Satellites; Transformers;

fLanguage

English

Publisher

ieee

Conference_Titel

CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference. The Experience of Designing and Application of

Print_ISBN

966-553-278-2

Type

conf

DOI

10.1109/CADSM.2003.1255164

Filename

1255164