DocumentCode :
2428630
Title :
Development of Junction Temperature Decision (JTD) Map for Thermal Design of Nano-scale Devices Considering Leakage Power
Author :
Im, Yunhyeok ; Cho, Eun Seok ; Choi, Kiwon ; Kang, Sayoon
Author_Institution :
Samsung Electron. Co., Ltd, Yongin
fYear :
2007
fDate :
18-22 March 2007
Firstpage :
63
Lastpage :
67
Abstract :
As semiconductor technology keeps scaling down, leakage power grows significantly due to the reduction in threshold voltage, channel length, and gate oxide thickness. As the junction temperature increases in nano-scale devices, leakage power increases drastically. This phenomenon motivates the processor and package designers to take into account thermal effects due to the large leakage power for highly reliable design of high-performance systems. In this paper, an analytical methodology for estimating the junction temperature and initial temperature range was provided to avoid diverging junction temperature status in nano-scale devices. For this purpose, junction temperature decision (JTD) map and initial temperature limit (ITL) map was newly introduced.
Keywords :
junction gate field effect transistors; nanoelectronics; thermal management (packaging); thermal resistance; initial temperature limit map; junction temperature decision map; leakage power; nano-scale devices; thermal design; thermal resistance; Electronic packaging thermal management; Mechanical engineering; Nanoscale devices; Power system reliability; Process design; Temperature distribution; Thermal engineering; Thermal resistance; Threshold voltage; Very large scale integration; CJT Curve; ITL Map; JTD Map; Leakage Power; Nano-scale Devices; Thermal Resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE
Conference_Location :
San Jose, CA
ISSN :
1065-2221
Print_ISBN :
1-4244-09589-4
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2007.352407
Filename :
4160888
Link To Document :
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