• DocumentCode
    2428671
  • Title

    Design, manufacture and test-quality cost estimation

  • Author

    Gilbert, J.M. ; Bell, I.M. ; Johnson, D.R.

  • Author_Institution
    Dept. of Eng., Hull Univ., UK
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    200
  • Lastpage
    205
  • Abstract
    This paper describes the adaptation of the conformability analysis technique to the assessment of functional, manufacturing and test capability of PCB level electronic circuits. It combines process capability indices and failure modes and effects analysis (FMEA) with cost mapping to allow the quality costs associated with design and manufacture induced faults to be estimated and the effectiveness of test strategies in reducing these costs to be determined. It allows the trade-off between these costs and the component, manufacturing process and test costs to be explored. The technique is particularly applicable to the relatively low complexity analogue and mixed signal safety critical circuits typically found in automotive and aircraft electronic systems.
  • Keywords
    circuit reliability; costing; failure analysis; printed circuit design; printed circuit manufacture; printed circuit testing; quality control; FMEA; PCB design; PCB level electronic circuits; PCB manufacture; PCB test; aircraft electronic systems; analogue safety critical circuits; automotive electronic systems; component costs; conformability analysis technique; cost mapping; design induced faults; failure modes/effects analysis; functional capability; low complexity circuits; manufacture induced faults; manufacturing capability; manufacturing process costs; mixed signal safety critical circuits; process capability indices; quality cost estimation; quality costs; test capability; test costs; test strategy effectiveness; Air safety; Automotive engineering; Circuit faults; Circuit testing; Costs; Electronic circuits; Electronic equipment testing; Failure analysis; Manufacturing processes; Pulp manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2002. Proceedings. International Symposium on
  • Print_ISBN
    0-7695-1561-4
  • Type

    conf

  • DOI
    10.1109/ISQED.2002.996730
  • Filename
    996730