Title :
A Fixed-Angle Heat Spreading Model for Dynamic Thermal Characterization of Rear-Cooled Substrates
Author :
Vermeersch, Bjorn ; Mey, Gilbert De
Author_Institution :
Dept. of Electron. & Inf. Syst., Ghent Univ., Gent
Abstract :
During a period of almost 40 years already, various fixed-angle heat spreading models have been developed in the literature. These models can be used by thermal engineers as approximations for the thermal steady state resistance of a heat source on a rear-cooled substrate. In this paper an extension of these models to dynamic (time-dependent) phenomena is proposed. The heat dissipated by a square source (side a) is assumed to spread out into the substrate (thickness ts) under a fixed angle Phi. An analytical solution for the complex thermal impedance Zth(jomega) in phasor notation is derived. The obtained expression, in which Phi is used as a fitting parameter, is compared with exact results. A very good agreement is observed (average relative error less than 6%) for a wide range of the normalized thickness lambda = ts/a. A compact expression for the optimal heat spreading angle as a function of lambda is given. Finally the temperature response to a heat power step is investigated. A simple formula for the thermal rise time is provided, allowing a thermal designer to make quick yet accurate estimations about the dynamic behavior of the device.
Keywords :
hybrid integrated circuits; substrates; thermal conductivity; thermal conductivity measurement; thermal resistance; thermal resistance measurement; complex thermal impedance; dynamic thermal characterization; fixed-angle heat spreading model; heat source; phasor notation; rear-cooled substrates; thermal steady state resistance; Computational modeling; Immune system; Impedance; Information systems; Prototypes; Steady-state; Temperature; Thermal conductivity; Thermal engineering; Thermal resistance; Dynamic model; fixed angle; heat spreading; rear cooling; substrate; thermal impedance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-09589-4
Electronic_ISBN :
1065-2221
DOI :
10.1109/STHERM.2007.352393