Title :
Process Development for Heat Sink Attachment Using Thermally Conductive Liquid Adhesives
Author :
Cho, Sang-jeon ; Allen, Emily ; Nguyen, Don ; Chu, Quyen
Author_Institution :
Dept. of Chem. & Mater. Eng., San Jose State Univ., CA
Abstract :
Premature field failure of heat sink attachments is one of the most important concerns in the microelectronic packaging industry. In order to minimize failure problems, this study focused on the optimization of the heat sink attachment process and development of an adhesion inspection method. Acrylic-based liquid adhesives were selected for this study to deliver mechanical adhesion strength and high thermal performance of heat sink attachment. Optimal process conditions for volume, mounting pressure, and pressing time were obtained from volume consistency testing, torsion testing, and thermal resistance measurements. Failure analysis was conducted on fracture surfaces after torsion testing. Two failure modes were discovered: interface failure and bulk materials failure. Bond line thickness greater than 254 microns (10 mils), produced more materials failure, which caused reduction in torsion strength. Maximum strength and thermal performance were obtained using contact area of 50% or greater and bond line thickness of 203-254 microns (8-10 mils). Temperature cycling results will also be presented. Torsion test screening was selected to verify heat sink attachment integrity during real-time quality assurance. The torsion strength of a whole soldered package joint was calculated from the nominal shear strength of individual solder joints using the total area approximation. This calculated torsion strength for the package sets an upper limit to torsion testing values.
Keywords :
conductive adhesives; failure analysis; heat sinks; thermal conductivity; adhesion inspection method; bond line thickness; contact area; failure analysis; heat sink attachment; microelectronic packaging industry; process development; solder joint; thermal resistance measurements; thermally conductive liquid adhesives; torsion strength; torsion testing; volume consistency testing; Adhesives; Bonding; Conducting materials; Heat sinks; Inspection; Microelectronics; Optimization methods; Packaging; Testing; Thermal conductivity; ASTM-5470; Bond Line Thickness; Contact Area; Heat sink; Liquid Adhesives; Solder Joint; Thermal Resistance; Torsion Strength;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-09589-4
Electronic_ISBN :
1065-2221
DOI :
10.1109/STHERM.2007.352396