• DocumentCode
    2428912
  • Title

    Characterization and application of rapid thermal oxide surface passivation for the highest efficiency RTP silicon solar cells

  • Author

    Doshi, P. ; Moschner, J. ; Jeong, J. ; Rohatgi, A. ; Singh, R. ; Narayanan, S.

  • Author_Institution
    Univ. Center of Excellence for Photovoltaics Res. & Educ., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    87
  • Lastpage
    90
  • Abstract
    This paper presents the development and analysis of the first 19%-efficient silicon solar cells fabricated by rapid thermal processing (RTP). These cells required no high-temperature conventional furnace processing (CFP). Improved front surface passivation by rapid thermal oxidation (RTO) was found to reduce Sfront from 7.5×10 5 to 2×104 cm/s, decrease J0e by almost an order of magnitude, and increase cell efficiency by about 1% (absolute). An additional 1% gain in efficiency was achieved by applying a thicker screen-printed, RTP-alloyed Al-BSF instead of the standard 1 μm evaporated Al-BSF. Because of the rapid heating rate in RTP, the RTP Al-BSF also gives a more uniform and effective BSF compared with the CFP Al-BSF. In comparison with furnace processed cells, this RTP/RTO process reduced the time for diffusion and oxidation from 330 to 10 min without sacrificing efficiency. To reduce back surface recombination further, RTO can be grown on the back. PCD characterization of RTO on 1.3 Ωcm Si reveals an Sback well below 100 cm/s, which can result in >20% efficient RTP/RTO cells
  • Keywords
    elemental semiconductors; oxidation; passivation; rapid thermal processing; silicon; solar cells; surface recombination; 19 percent; RTP silicon solar cells; Si; Si solar cells; back surface recombination reduction; cell efficiency increase; diffusion time reduction; emitter surfaces; front surface passivation; oxidation time reduction; rapid heating rate; rapid thermal oxidation; rapid thermal oxide surface passivation; rapid thermal processing; Annealing; Application software; Degradation; Furnaces; Lithography; Oxidation; Passivation; Photovoltaic cells; Production; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.653931
  • Filename
    653931