DocumentCode
2428971
Title
Simulation studies and modeling of Short Circuit current oscillations in IGBTs
Author
Milady, S. ; Silber, D. ; Pfirsch, F. ; Niedernostheide, F.-J.
Author_Institution
Inst. for Electr. Drives, Power Electron. & Devices, Univ. of Bremen, Bremen, Germany
fYear
2009
fDate
14-18 June 2009
Firstpage
37
Lastpage
40
Abstract
During Short-Circuit (SC) operations, strong current oscillations of IGBTs can appear. Simulation studies also confirm this. No parasitic inductances are required for such oscillations. A simplified equivalent circuit of the device, which is basically an RC oscillator, is able to reproduce the oscillations. The occurrence of oscillations depends on the model parameters, which can be related to the device structure and other conditions such as the gate resistance value, gate biasing, and DC-link voltage. This paper also shows that application of basic system theory methods to AC small-signal device simulation results (frequency-domain analysis under small-signal conditions) is appropriate to analyze the stability range of the IGBT under Short-Circuit.
Keywords
RC circuits; equivalent circuits; inductance; insulated gate bipolar transistors; short-circuit currents; AC small-signal device simulation; DC-link voltage; IGBT; RC oscillator; current oscillations; device structure; equivalent circuit; frequency-domain analysis; gate biasing; gate resistance; parasitic inductances; short-circuit operations; Analytical models; Anodes; Cathodes; Circuit simulation; Frequency domain analysis; Insulated gate bipolar transistors; Roentgenium; Short circuit currents; Steady-state; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
Conference_Location
Barcelona
ISSN
1943-653X
Print_ISBN
978-1-4244-3525-8
Electronic_ISBN
1943-653X
Type
conf
DOI
10.1109/ISPSD.2009.5157995
Filename
5157995
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