• DocumentCode
    2428971
  • Title

    Simulation studies and modeling of Short Circuit current oscillations in IGBTs

  • Author

    Milady, S. ; Silber, D. ; Pfirsch, F. ; Niedernostheide, F.-J.

  • Author_Institution
    Inst. for Electr. Drives, Power Electron. & Devices, Univ. of Bremen, Bremen, Germany
  • fYear
    2009
  • fDate
    14-18 June 2009
  • Firstpage
    37
  • Lastpage
    40
  • Abstract
    During Short-Circuit (SC) operations, strong current oscillations of IGBTs can appear. Simulation studies also confirm this. No parasitic inductances are required for such oscillations. A simplified equivalent circuit of the device, which is basically an RC oscillator, is able to reproduce the oscillations. The occurrence of oscillations depends on the model parameters, which can be related to the device structure and other conditions such as the gate resistance value, gate biasing, and DC-link voltage. This paper also shows that application of basic system theory methods to AC small-signal device simulation results (frequency-domain analysis under small-signal conditions) is appropriate to analyze the stability range of the IGBT under Short-Circuit.
  • Keywords
    RC circuits; equivalent circuits; inductance; insulated gate bipolar transistors; short-circuit currents; AC small-signal device simulation; DC-link voltage; IGBT; RC oscillator; current oscillations; device structure; equivalent circuit; frequency-domain analysis; gate biasing; gate resistance; parasitic inductances; short-circuit operations; Analytical models; Anodes; Cathodes; Circuit simulation; Frequency domain analysis; Insulated gate bipolar transistors; Roentgenium; Short circuit currents; Steady-state; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
  • Conference_Location
    Barcelona
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4244-3525-8
  • Electronic_ISBN
    1943-653X
  • Type

    conf

  • DOI
    10.1109/ISPSD.2009.5157995
  • Filename
    5157995