DocumentCode :
2429165
Title :
A New Approach to Boundary Condition Independent Compact Dynamic Thermal Models
Author :
Augustin, Adam ; Hauck, Torsten
Author_Institution :
Freescale Semicond., Munich
fYear :
2007
fDate :
18-22 March 2007
Firstpage :
228
Lastpage :
232
Abstract :
The paper introduces a new method for the generation of boundary condition independent dynamic thermal compact models. The procedure starts with a description of the component (e.g. semiconductor package, printed circuit board, etc.) and associated thermal ports at the continuous field level with a finite element code. Using order reduction methods a low order state space model is generated which represents the thermal behavior of the component. Additional matrix manipulations are applied to transform the state space model into a Kirchhoffian network that provides the transfer functions between all thermal ports. The method is demonstrated on an example from the semiconductor industry with a device package placed on a printed circuit board. By means of model coupling thermal simulation of the system is performed using the new boundary condition independent compact model. The results are finally compared to appropriate finite element simulations.
Keywords :
semiconductor device models; thermal analysis; thermal management (packaging); Kirchhoffian network; boundary condition independent compact dynamic thermal models; continuous field level; finite element code; low order state space model; matrix manipulations; model coupling thermal simulation; order reduction methods; thermal ports; transfer functions; Boundary conditions; Circuit simulation; Coupling circuits; Electronics industry; Finite element methods; Printed circuits; Semiconductor device packaging; State-space methods; Transfer functions; Transmission line matrix methods; BCI; compact thermal model; network model; transient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE
Conference_Location :
San Jose, CA
ISSN :
1065-2221
Print_ISBN :
1-4244-09589-4
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2007.352428
Filename :
4160916
Link To Document :
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