DocumentCode :
2429420
Title :
High current repetitive avalanche of low voltage trench power MOSFETs
Author :
Rutter, P. ; Heppenstall, K. ; Koh, A. ; Petkos, G. ; Blondel, G.
Author_Institution :
NXP Semicond., Stockport, UK
fYear :
2009
fDate :
14-18 June 2009
Firstpage :
112
Lastpage :
115
Abstract :
The capability of 20 V trench power MOSFETs to withstand high current repetitive avalanche events has been investigated. Automotive standard 20 V BVdss rated MOSFETs with active area of 21 mm2 have been successfully subjected with up to 300 million 59 mus duration avalanche events at peak currents up to 135 A whilst held at an average junction temperature of 150degC. The effect of cell pitch on parameter shifts has been investigated by applying avalanche currents up to 200 A (9.5 A/mm2). It has been found that reduced cell pitch increases the stability of threshold voltage and on-state resistance whilst suffering from increased drain-source leakage.
Keywords :
power MOSFET; current 135 A; current 200 A; high current repetitive avalanche; low voltage trench power MOSFET; temperature 150 degC; time 59 mus; voltage 20 V; Automotive engineering; Avalanche breakdown; Current density; Failure analysis; Global warming; Low voltage; MOSFETs; Silicon; Temperature; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
Conference_Location :
Barcelona
ISSN :
1943-653X
Print_ISBN :
978-1-4244-3525-8
Electronic_ISBN :
1943-653X
Type :
conf
DOI :
10.1109/ISPSD.2009.5158014
Filename :
5158014
Link To Document :
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