Title :
Detection of harmonic signal with phase shift for single electron spin microscopy
Author :
Chen, Huimin ; Moura, José M F
Author_Institution :
University of New Orleans
Keywords :
Detectors; Electron microscopy; Gaussian noise; Minimax techniques; Phase detection; Phase noise; Power harmonic filters; Signal detection; Signal processing; Testing;
Conference_Titel :
Information Fusion, 2003. Proceedings of the Sixth International Conference of
Conference_Location :
Cairns, Queensland, Australia
Print_ISBN :
0-9721844-4-9
DOI :
10.1109/ICIF.2003.177355
