DocumentCode :
2429442
Title :
Ultrasonic Attenuation by Impurities in Semiconductors
Author :
Mikoshiba, N. ; Isawa, Y. ; Takeuti, Y.
fYear :
1976
fDate :
1976
Firstpage :
624
Lastpage :
628
Keywords :
Attenuation; Charge carrier processes; Equations; Frequency; Green´s function methods; Magnetic field measurement; Resonance; Samarium; Semiconductor impurities; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1976 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1976.196756
Filename :
1533696
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2429442
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