On chip crosstalk characterization on deep submicron buses

Author

Bendhia, Sonia Delmas ; Caignet, Fabrice ; Sicard, Etienne

Author_Institution

Dept. of Comput. & Electr. Eng., Inst. Nat. des Sci. Appliquees, Toulouse, France

fYear

2000

fDate

2000

Abstract

This paper presents the experimental measurement of crosstalk effects in 0.18 μm CMOS technology. Based on an on-chip measurement method, we characterize crosstalk on typical interconnect buses for different length of coupled lines, and deduce guidelines concerning critical coupled line length. The effect of the number of aggressors switching simultaneously, on the victim line, is also analyzed

Keywords

CMOS digital integrated circuits; VLSI; coupled transmission lines; crosstalk; electric variables measurement; integrated circuit interconnections; integrated circuit measurement; 0.18 micron; CMOS technology; coupled lines; critical coupled line length; crosstalk effects measurement; deep submicron buses; interconnect buses; onchip crosstalk characterization; onchip measurement method; simultaneous switching; CMOS technology; Circuit testing; Coupling circuits; Crosstalk; Integrated circuit interconnections; Integrated circuit technology; Probes; Sampling methods; Semiconductor device measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Devices, Circuits and Systems, 2000. Proceedings of the 2000 Third IEEE International Caracas Conference on

Conference_Location

Cancun

Print_ISBN

0-7803-5766-3

Type

conf

DOI

10.1109/ICCDCS.2000.869815

Filename

869815