Title :
On chip crosstalk characterization on deep submicron buses
Author :
Bendhia, Sonia Delmas ; Caignet, Fabrice ; Sicard, Etienne
Author_Institution :
Dept. of Comput. & Electr. Eng., Inst. Nat. des Sci. Appliquees, Toulouse, France
Abstract :
This paper presents the experimental measurement of crosstalk effects in 0.18 μm CMOS technology. Based on an on-chip measurement method, we characterize crosstalk on typical interconnect buses for different length of coupled lines, and deduce guidelines concerning critical coupled line length. The effect of the number of aggressors switching simultaneously, on the victim line, is also analyzed
Keywords :
CMOS digital integrated circuits; VLSI; coupled transmission lines; crosstalk; electric variables measurement; integrated circuit interconnections; integrated circuit measurement; 0.18 micron; CMOS technology; coupled lines; critical coupled line length; crosstalk effects measurement; deep submicron buses; interconnect buses; onchip crosstalk characterization; onchip measurement method; simultaneous switching; CMOS technology; Circuit testing; Coupling circuits; Crosstalk; Integrated circuit interconnections; Integrated circuit technology; Probes; Sampling methods; Semiconductor device measurement; Voltage;
Conference_Titel :
Devices, Circuits and Systems, 2000. Proceedings of the 2000 Third IEEE International Caracas Conference on
Conference_Location :
Cancun
Print_ISBN :
0-7803-5766-3
DOI :
10.1109/ICCDCS.2000.869815
