DocumentCode :
2429729
Title :
The 3.3kV Semi-SuperJunction IGBT for increased cosmic ray induced breakdown immunity
Author :
Antoniou, Marina ; Udrea, Florin ; Bauer, Friedhelm
Author_Institution :
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
fYear :
2009
fDate :
14-18 June 2009
Firstpage :
168
Lastpage :
171
Abstract :
In this paper we propose and describe a new device, the 3.3 kV semi-superjunction insulated gate bipolar transistor (Semi SJ IGBT). The device offers significant improvement in the on-state and switching trade-off compared to both state-of the-art field stop (FS) trench IGBT and the Full SJ IGBT; There is no need for very deep pillars, therefore the ease of manufacturing is improved as the device can be based on the dasiapresentpsila CoolMOS type technology for formation of n & p pillars for 600-1 kV. This makes the device a potential winner for the 3.3 kV or even greater voltage ranges (e.g. 6.5 kV). Furthermore the device offers considerably better robustness against cosmic rays when compared to a conventional FS IGBT. Here we demonstrate via analytical modeling that the FIT (Failure in Time) levels can be improved by one to two orders of magnitude.
Keywords :
insulated gate bipolar transistors; cosmic ray induced breakdown immunity; insulated gate bipolar transistor; superjunction; voltage 3.3 kV; voltage 6.5 kV; voltage 600 V to 1 kV; Breakdown voltage; Cosmic rays; Doping; Electric breakdown; Electrons; Insulated gate bipolar transistors; Manufacturing; Plasmas; Rails; Robustness; Cosmic Ray; IGBT; SuperJunction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
Conference_Location :
Barcelona
ISSN :
1943-653X
Print_ISBN :
978-1-4244-3525-8
Electronic_ISBN :
1943-653X
Type :
conf
DOI :
10.1109/ISPSD.2009.5158028
Filename :
5158028
Link To Document :
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