DocumentCode :
2429784
Title :
A high speed pulser thyristor
Author :
Craig, Alexander H. ; Hopkins, Douglas C. ; Driscoll, John C.
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Binghamton, NY, USA
Volume :
2
fYear :
1998
fDate :
15-19 Feb 1998
Firstpage :
737
Abstract :
A pulse power thyristor (PPT), has features optimized for pulse power applications: high di/dt, compact size and high current densities >104 A/cm2. These features are enabled by enhancing the turn-on mechanism through field aided drift and a very high level of gate-cathode interdigitation. The technology allows high blocking voltage >5 kV in small, low cost packages. The device described in this paper is optimized for turn-on and, as such, is labeled a pulse power closing switch thyristor (PPCST). The device structure is briefly discussed along with details of field aided drift as a critical dynamic mechanism. A trade-off for fast turn-on shows that the dynamic resistance and leakage currents are higher than typical thyristors. A major attribute of the device design is to self limit the anode di/dt without self-destruction or having the requirement for series inductors. A dynamic test circuit was developed with the potential of greater than 110 kA/μs. Test results show that the di/dt is limited by the PPCST and not inductance. The current rise from 10% to 90% occurs within 260 ns to a peak current of 4.85 kA to yield a di/dt of 14.9 kA/μs. The 10% to 70% rise yields better than 20 kA/μs. During rapid di/dt of anode current the gate-to-cathode voltage became excessive. There, also, was an indication of possible current flow out of the gate during the same interval. Thus, an ultra-fast constant-current gate drive circuit was developed. The drive delivered 0 to 30 A in <400 ns and maintained the 30 A during the entire turn on interval. The excessive voltage was due to 5 nH of internal package inductance
Keywords :
cathodes; circuit testing; current density; driver circuits; inductance; leakage currents; power semiconductor switches; pulsed power switches; thyristor circuits; 0 to 30 A; 4.85 kA; 400 ns; compact size; critical dynamic mechanism; current rise; dynamic resistance; dynamic test circuit; field aided drift; gate drive circuit; gate-cathode interdigitation; gate-to-cathode voltage; high blocking voltage; high current densities; high di/dt; high speed pulser thyristor; internal package inductance; leakage currents; pulse power applications; pulse power closing switch thyristor; pulse power thyristor; turn-on mechanism; turn-on optimisation; ultra-fast constant-current gate drive circuit; Anodes; Circuit testing; Costs; Current density; Inductance; Leakage current; Packaging; Switches; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1998. APEC '98. Conference Proceedings 1998., Thirteenth Annual
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4340-9
Type :
conf
DOI :
10.1109/APEC.1998.653980
Filename :
653980
Link To Document :
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