Title :
Electrothermal model of a fuse
Author :
Duong, S. ; Marechal, Y. ; Schaeffer, C. ; Mulertt, C. ; Sarrus, F. ; Gelet, J.L.
Author_Institution :
Lab. d´´Electrotech. de Grenoble, CNRS, St. Martin d´´Heres, France
Abstract :
Nowadays, power electronic applications operate with very high frequency. Fuses used for the protection of semiconductors may be affected by such high frequency. Thus, fuses have to be derated according to frequency and distance from the return conductor. Here, an electrothermal model of a fuse is proposed. From this model, current and temperature distribution can be calculated. Derating characteristics can then be obtained in order to prevent unexpected melting or thermal ageing
Keywords :
current distribution; electric fuses; power semiconductor devices; protection; semiconductor device models; temperature distribution; thermal analysis; current distribution; derating characteristics; electrothermal model; high frequency operation; melting; power electronic applications; semiconductor protection fuses; temperature distribution; thermal ageing; Conductors; Electrothermal effects; Frequency; Fuses; Power electronics; Protection; Proximity effect; Semiconductor devices; Skin; Temperature distribution;
Conference_Titel :
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3544-9
DOI :
10.1109/IAS.1996.559234
