Electrothermal model of a fuse

Author

Duong, S. ; Marechal, Y. ; Schaeffer, C. ; Mulertt, C. ; Sarrus, F. ; Gelet, J.L.

Author_Institution

Lab. d´´Electrotech. de Grenoble, CNRS, St. Martin d´´Heres, France

Volume

3

fYear

1996

fDate

6-10 Oct 1996

Firstpage

1302

Abstract

Nowadays, power electronic applications operate with very high frequency. Fuses used for the protection of semiconductors may be affected by such high frequency. Thus, fuses have to be derated according to frequency and distance from the return conductor. Here, an electrothermal model of a fuse is proposed. From this model, current and temperature distribution can be calculated. Derating characteristics can then be obtained in order to prevent unexpected melting or thermal ageing

Keywords

current distribution; electric fuses; power semiconductor devices; protection; semiconductor device models; temperature distribution; thermal analysis; current distribution; derating characteristics; electrothermal model; high frequency operation; melting; power electronic applications; semiconductor protection fuses; temperature distribution; thermal ageing; Conductors; Electrothermal effects; Frequency; Fuses; Power electronics; Protection; Proximity effect; Semiconductor devices; Skin; Temperature distribution;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE

Conference_Location

San Diego, CA

ISSN

0197-2618

Print_ISBN

0-7803-3544-9

Type

conf

DOI

10.1109/IAS.1996.559234

Filename

559234