Title :
A vertical SiC JFET with a monolithically integrated JBS diode
Author :
Sheng, K. ; Radhakrishnan, R. ; Zhang, Y. ; Zhao, J.H.
Author_Institution :
Electr. & Comp. Eng. Dept, Rutgers Univ., Piscataway, NJ, USA
Abstract :
It is desirable for many power applications to integrate a power switch and its reverse-parallel diode onto the same chip/package to reduce component count and improve circuit reliability and integrity. In this paper, a SiC vertical JFET with a monolithically integrated JBS diode is proposed, fabricated and characterized. The integrated switch uses a process similar to that of a traditional SiC vertical JFET. The experimental results show that, in the reverse direction, the integrated switch, can conduct current by utilizing both the integrated diode and the JFET channel. This can be utilized to significantly reduce the device conduction loss in power electronic applications.
Keywords :
junction gate field effect transistors; monolithic integrated circuits; power electronics; semiconductor diodes; silicon compounds; wide band gap semiconductors; SiC; circuit integrity; circuit reliability; device conduction loss; integrated switch; monolithically integrated diode; power electronic applications; power switch; reverse-parallel diode; vertical JFET; Circuits; Fabrication; Ohmic contacts; Packaging; Power electronics; Schottky barriers; Schottky diodes; Silicon carbide; Switches; Voltage;
Conference_Titel :
Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4244-3525-8
Electronic_ISBN :
1943-653X
DOI :
10.1109/ISPSD.2009.5158050