Title :
Permeability anomaly of Co-based amorphous thin-film stripes
Author :
Hamakawa, Y. ; Sasaki, S. ; Yuitoo, I. ; Shiiki, K.
Author_Institution :
Hitachi, Ltd.
Keywords :
Amorphous materials; Chromium; Frequency dependence; Frequency measurement; Magnetic films; Magnetic force microscopy; Magnetic heads; Permeability measurement; Saturation magnetization; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696320