DocumentCode
2430261
Title
Design and investigation of frequency capability of 15kV 4H-SiC IGBT
Author
Sung, Woongje ; Wang, Jun ; Huang, Alex Q. ; Baliga, B.Jayant
Author_Institution
Future Renewable Electr. Energy Delivery & Manage. (FREEDM) Syst. Center, North Carolina State Univ., Raleigh, NC, USA
fYear
2009
fDate
14-18 June 2009
Firstpage
271
Lastpage
274
Abstract
15 kV 4H-SiC n-channel asymmetric and symmetric IGBTs were designed to minimize the on state and switching power loss. A current enhancement layer was adopted to reduce the forward voltage drop for each IGBTs. For the asymmetric IGBT, it was found that the frequency capability of the device was affected most by adjusting the buffer region parameters such as doping concentration, thickness, and lifetime. For the symmetric IGBT, the p+ substrate doping concentration and drift region lifetime were investigated to obtain maximum switching frequency capability. A comparison of frequency capabilities between power MOSFETs, asymmetric, and symmetric IGBTs has been made. IGBTs provide lower power loss than power MOSFETs up to approximately 7 kHz.
Keywords
insulated gate bipolar transistors; power semiconductor devices; semiconductor doping; silicon compounds; wide band gap semiconductors; SiC; current enhancement layer; drift region lifetime; forward voltage drop; n-channel asymmetric IGBT; p+ substrate doping concentration; switching power loss; symmetric IGBT; voltage 15 kV; Buffer layers; Doping; Insulated gate bipolar transistors; MOSFETs; Neodymium; Silicon carbide; Switching frequency; Temperature; Thermal conductivity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
Conference_Location
Barcelona
ISSN
1943-653X
Print_ISBN
978-1-4244-3525-8
Electronic_ISBN
1943-653X
Type
conf
DOI
10.1109/ISPSD.2009.5158054
Filename
5158054
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