DocumentCode
2430269
Title
MAC layer misbehavior effectiveness and collective aggressive reaction approach
Author
Giri, Vamshikrishna Reddy ; Jaggi, Neeraj
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Wichita State Univ., Wichita, KS, USA
fYear
2010
fDate
12-14 April 2010
Firstpage
1
Lastpage
5
Abstract
Current wireless MAC protocols are designed to provide an equal share of throughput to all nodes in the network. However, the presence of misbehaving nodes (selfish nodes which deviate from standard protocol behavior in order to get higher bandwidth) poses severe threats to the fairness aspects of MAC protocols. In this paper, we investigate various types of MAC layer misbehaviors, and evaluate their effectiveness in terms of their impact on important performance aspects including throughput, and fairness to other users. We observe that the effects of misbehavior are prominent only when the network traffic is sufficiently large and the extent of misbehavior is reasonably aggressive. In addition, we find that performance gains achieved using misbehavior exhibit diminishing returns with respect to its aggressiveness, for all types of misbehaviors considered. We identify crucial common characteristics among such misbehaviors, and employ our learning to design an effective measure to react towards such misbehaviors. Employing two of the most effective misbehaviors, we study the effect of collective aggressiveness of non-selfish nodes as a possible strategy to react towards selfish misbehavior. Particularly, we demonstrate that a collective aggressive reaction approach is able to ensure fairness in the network, however at the expense of overall network throughput degradation.
Keywords
access protocols; wireless LAN; MAC layer misbehavior effectiveness; MAC protocols; collective aggressive reaction approach; network throughput degradation; Access protocols; Bandwidth; Degradation; Media Access Protocol; Performance gain; Spine; Telecommunication traffic; Throughput; Wireless LAN; Wireless application protocol;
fLanguage
English
Publisher
ieee
Conference_Titel
Sarnoff Symposium, 2010 IEEE
Conference_Location
Princeton, NJ
Print_ISBN
978-1-4244-5592-8
Type
conf
DOI
10.1109/SARNOF.2010.5469805
Filename
5469805
Link To Document