DocumentCode :
243039
Title :
III-Nitride Nanowire Light Sources
Author :
Bhattacharya, Pallab
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2014
fDate :
14-16 July 2014
Firstpage :
25
Lastpage :
26
Abstract :
In(Ga)N nanowires can be grown catalyst-free on silicon substrates by molecular beam epitaxy with density in the range of 108-1011cm-2 and lengths in the range of a few micrometers depending on the growth time. The nanowires grow vertically in the wurtzite crystalline form and the In composition of the nanowire can be varied to produce emission in the range of 366-700nm. Most importantly, extensive structural characterization by several groups, including ours, indicates that the nanowires are free of extended defects such as dislocations, stacking faults, and twins. It has also been reported that the measured surface recombination velocity in GaN nanowires is very small and ~103cm/s. Temperature dependent luminescence of the nanowires does not exhibit any blue shift, usually attributed to trapping of carriers in localized defects. Due to radial relaxation of strain during epitaxy, the polarization fields in nanowire heterostructures is significantly smaller than those in bulk heterostructures. This reduces the blue shift of the emission peak with injection due to the quantum confined Stark effect. Single or an array of such nanowires can therefore provide an excellent platform for the realization of advanced light sources with unique characteristics. In this talk I will describe the properties of a few such devices being investigated in our group.
Keywords :
III-V semiconductors; indium compounds; light sources; molecular beam epitaxial growth; nanophotonics; nanowires; optical materials; photoluminescence; quantum confined Stark effect; spectral line shift; surface recombination; III-nitride nanowire light sources; In(Ga)N nanowires; InGaN; advanced light sources; blue shift; bulk heterostructures; carrier trapping; catalyst-free; dislocations; emission peak; extended defects; extensive structural characterization; growth time; localized defects; molecular beam epitaxy; nanowire array; nanowire composition; nanowire heterostructures; polarization fields; quantum confined Stark effect; radial relaxation; silicon substrates; single nanowire; stacking faults; strain; surface recombination velocity; temperature dependent luminescence; twins; wavelength 366 nm to 700 nm; wurtzite crystalline form; Excitons; Gallium nitride; Green products; Light emitting diodes; Photonics; Silicon; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics Society Summer Topical Meeting Series, 2014 IEEE
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4799-2766-1
Type :
conf
DOI :
10.1109/SUM.2014.20
Filename :
6902968
Link To Document :
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