Title :
A model validation approach to fault detection
Author :
Thapliyal, S. ; Faitakis, Y.E. ; Kantor, J.C.
Author_Institution :
Dept. of Chem. Eng., Notre Dame Univ., IN, USA
fDate :
29 June-1 July 1994
Abstract :
A model validation methodology in l1 has previously been proposed. This paper demonstrates the application of this method to the validation of a simplified SISO model. The minimum unmeasured disturbance and model perturbation that explain the measured input-output data are calculated.
Keywords :
fault location; frequency-domain analysis; modelling; time-domain analysis; transient response; fault detection; minimum unmeasured disturbance; model perturbation; model validation; simplified SISO model; Additives; Chemical engineering; Fault detection; Finite impulse response filter; Robustness; Testing; Uncertainty;
Conference_Titel :
American Control Conference, 1994
Print_ISBN :
0-7803-1783-1
DOI :
10.1109/ACC.1994.735128
