مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2430520

Title :

High Frequency Defect Characterization

Author :

Khuri-Yakub, B.T. ; Kino, G.S.

fYear :

1977

fDate :

1977

Firstpage :

139

Lastpage :

141

Keywords :

Bandwidth; Frequency domain analysis; Frequency response; Laboratories; Scattering; Signal processing; Silicon carbide; System testing; Ultrasonic transducers; Zinc oxide;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Ultrasonics Symposium, 1977

Type :

conf

DOI :

10.1109/ULTSYM.1977.196810

Filename :

1533750

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2430520