DocumentCode
2430520
Title
High Frequency Defect Characterization
Author
Khuri-Yakub, B.T. ; Kino, G.S.
fYear
1977
fDate
1977
Firstpage
139
Lastpage
141
Keywords
Bandwidth; Frequency domain analysis; Frequency response; Laboratories; Scattering; Signal processing; Silicon carbide; System testing; Ultrasonic transducers; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1977
Type
conf
DOI
10.1109/ULTSYM.1977.196810
Filename
1533750
Link To Document