• DocumentCode
    243067
  • Title

    The effect of temperature on the reliability of electronic components

  • Author

    Lakshminarayanan, Vasudevan ; Sriraam, N.

  • Author_Institution
    Centre for Dev. of Telematics, TL-Process Manage., Bangalore, India
  • fYear
    2014
  • fDate
    6-7 Jan. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Reliability of electronic systems for operating in all types of environments has become a necessity. The progressive miniaturization in electronics, packaging of a large number of active devices per unit area of the component due to higher integration levels, higher power density per unit area, need for low- cost and reliable products, and the wide range of applications in specialized commercial, avionics, underground oil exploration, automotive, and other high temperature environments besides the normal commercial applications demands a high degree of reliable operation of the electronics under harsh environmental conditions. In such situations, reliability has to be built into the system by design, choice of suitable components, packaging and cooling techniques. This paper discusses the effect of temperature on the reliability of components used in typical electronic systems. Various models based on the temperature principle are discussed with illustrative examples for reliability calculations.Further, it is shown that by using the principle of cause - effect relationship, suitable methods can be applied to minimize failures of electronic components due to thermal stresses.
  • Keywords
    cooling; electronics packaging; failure analysis; reliability; active device per unit area; automotive; avionics; cause-effect relationship; cooling techniques; electronic component reliability; electronic packaging; electronic systems; failure minimization; high temperature environments; power density per unit area; temperature effect; thermal stresses; underground oil exploration; Assembly; Equations; Integrated circuits; Lattices; Mathematical model; Stress; Transistors; MTTF; Reliability; component; electronic; failures; semiconductor failure models; temperature; thermal stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Computing and Communication Technologies (IEEE CONECCT), 2014 IEEE International Conference on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4799-2318-2
  • Type

    conf

  • DOI
    10.1109/CONECCT.2014.6740182
  • Filename
    6740182