DocumentCode
2430773
Title
Foreword
fYear
2009
fDate
28-30 April 2009
Abstract
Presents the welcome message from the conference proceedings.
Keywords
Automatic testing; Circuit testing; Collaboration; Design automation; Electronics industry; Radio frequency; Silicon; Speech; Sun; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2009. VLSI-DAT '09. International Symposium on
Conference_Location
Hsinchu
Print_ISBN
978-1-4244-2781-9
Type
conf
DOI
10.1109/VDAT.2009.5158077
Filename
5158077
Link To Document