Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
Automatic testing; Circuit testing; Collaboration; Design automation; Electronics industry; Radio frequency; Silicon; Speech; Sun; Very large scale integration;
Conference_Titel :
VLSI Design, Automation and Test, 2009. VLSI-DAT '09. International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-2781-9
DOI :
10.1109/VDAT.2009.5158077
