DocumentCode
2430996
Title
The future of electrical I/O for microprocessors
Author
Mahony, Frank O. ; Balamurugan, Ganesh ; Jaussi, James E. ; Kennedy, Joseph ; Mansuri, Mozhgan ; Shekhar, Sudip ; Casper, Bryan
Author_Institution
Circuit Res. Lab., Intel, Hillsboro, OR, USA
fYear
2009
fDate
28-30 April 2009
Firstpage
31
Lastpage
34
Abstract
High-speed CMOS microprocessor I/O has scaled aggressively over the past decade in terms of power and performance largely due to advances in equalization and clocking techniques. With future multi-core processors expected to require >1TB/s bandwidth and dramatically improved power efficiency, there has been some question as to whether electrical I/O will continue to satisfy chip-to-chip communication requirements over the next decade. In this paper, we show that electrical signaling has the power, performance, and density scaling potential to enable the next several generations of systems and applications. Circuit innovation is aggressively pushing link power efficiency toward 1-2mW/Gb/s while departures from legacy channels to include new topologies and materials can significantly improve the power/performance/density tradeoff. Statistical link-level design tools that allow designers to rapidly quantify high-level architecture tradeoffs will enable balanced link designs that co-optimize power, performance, and channel topology.
Keywords
CMOS digital integrated circuits; clocks; equalisers; integrated circuit design; microprocessor chips; The chip-to-chip communication; balanced link designs; clocking; clocking techniques; electrical I/O; electrical signaling; equalization; high-level architecture; high-speed CMOS microprocessor; link power efficiency; multi-core processors; statistical link-level design tools; Aggregates; Bandwidth; Circuit topology; Clocks; Computer architecture; Microprocessors; Multicore processing; Power generation; Technological innovation; Transceivers; I/O; data link; electrical; low-power; microprocessor; scaling; signaling; transceiver; wireline;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2009. VLSI-DAT '09. International Symposium on
Conference_Location
Hsinchu
Print_ISBN
978-1-4244-2781-9
Electronic_ISBN
978-1-4244-2782-6
Type
conf
DOI
10.1109/VDAT.2009.5158087
Filename
5158087
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