Title :
Catastrophic Degradation in Quantum Cascade Lasers Emitting at 8.4 µm
Author :
Sin, Y. ; Presser, N. ; Brodie, Matthew ; Lingley, Z. ; Moss, Steven C. ; Kirch, J. ; Chang, C.C. ; Boyle, C. ; Mawst, L.J. ; Botez, D. ; Lindberg, D. ; Earles, T.
Author_Institution :
Electron. & Photonics Lab., Aerosp. Corp., El Segundo, CA, USA
Abstract :
We report on catastrophic degradation in 8.4 μm InGaAs-InAlAs quantum cascade lasers using focused ion beam (FIB) and high-resolution transmission electron microscope (HR-TEM) techniques.
Keywords :
III-V semiconductors; aluminium compounds; focused ion beam technology; gallium arsenide; indium compounds; quantum cascade lasers; transmission electron microscopy; InGaAs-InAlAs; InGaAs-InAlAs quantum cascade lasers; catastrophic degradation; focused ion beam techniques; high-resolution transmission electron microscope techniques; wavelength 8.4 mum; Degradation; Laser modes; Measurement by laser beam; Optical waveguides; Quantum cascade lasers; Waveguide lasers;
Conference_Titel :
Photonics Society Summer Topical Meeting Series, 2014 IEEE
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4799-2766-1
DOI :
10.1109/SUM.2014.46
