DocumentCode
243107
Title
Catastrophic Degradation in Quantum Cascade Lasers Emitting at 8.4 µm
Author
Sin, Y. ; Presser, N. ; Brodie, Matthew ; Lingley, Z. ; Moss, Steven C. ; Kirch, J. ; Chang, C.C. ; Boyle, C. ; Mawst, L.J. ; Botez, D. ; Lindberg, D. ; Earles, T.
Author_Institution
Electron. & Photonics Lab., Aerosp. Corp., El Segundo, CA, USA
fYear
2014
fDate
14-16 July 2014
Firstpage
75
Lastpage
76
Abstract
We report on catastrophic degradation in 8.4 μm InGaAs-InAlAs quantum cascade lasers using focused ion beam (FIB) and high-resolution transmission electron microscope (HR-TEM) techniques.
Keywords
III-V semiconductors; aluminium compounds; focused ion beam technology; gallium arsenide; indium compounds; quantum cascade lasers; transmission electron microscopy; InGaAs-InAlAs; InGaAs-InAlAs quantum cascade lasers; catastrophic degradation; focused ion beam techniques; high-resolution transmission electron microscope techniques; wavelength 8.4 mum; Degradation; Laser modes; Measurement by laser beam; Optical waveguides; Quantum cascade lasers; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics Society Summer Topical Meeting Series, 2014 IEEE
Conference_Location
Montreal, QC
Print_ISBN
978-1-4799-2766-1
Type
conf
DOI
10.1109/SUM.2014.46
Filename
6902994
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